Millimeter-Wave Dielectric Characterization System

Features and measurement capabilities

• The high-precision sample clamping, mirror
positioning, and sample thickness
measurement allows for accurate
characterization of the relative permittivity
and loss tangent of dielectric materials
• The minimum sample size 50×50 mm

Included tools

• Computer with software to control motors
and to control a VNA
• Software for calculation of permittivity and
loss tangent over for both a single
frequency as a frequency range
• One set of replaceable/upgradeable
mirrors and waveguides for a certain
frequency band
• Humidity, temperature, and acceleration


• Extra mirrors and waveguides
• Cabling
• Frequency extenders